Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions
書誌情報を取り込む- フォーマット
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- 図書
- 責任表示
- J.-M. Spaeth, H. Overhof
- 出版情報
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- Berlin : Springer , [2012], c2003
- 形態
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- xi, 490 p. : ill. ; 24 cm
- シリーズ名
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- Springer series in materials science ; 51 <BA00476831>
- 書誌ID
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- NT00003783
- 注記
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- Includes bibliographical references (p. [467]-484) and index
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- 言語
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- 英語
- 分類・件名
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- DCC:621.38152
- LCSH:Semiconductors--Defects
- LCSH:Semiconductors--Testing--Methodology
- LCSH:Nuclear magnetic resonance spectroscopy
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Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions
J.-M. Spaeth, H. Overhof Springer, c2003


