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他アクションPoint defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions
書誌情報を取り込む- フォーマット
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- 図書
- 責任表示
- J.-M. Spaeth, H. Overhof
- 出版情報
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- Berlin ; Tokyo : Springer , c2003
- 形態
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- xi, 490 p : ill ; 24 cm
- ISBN
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9783540426950
[3540426957]
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9783540426950
[3540426957]
- シリーズ名
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- Springer series in materials science ; 51 <BA00476831>
- 書誌ID
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- BA61144314
- 注記
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- Includes bibliographical references and index
- E-Resources
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- 言語
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- 英語
- 分類・件名
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- DCC：621.38152
- LCSH：Semiconductors--Defects
- LCSH：Semiconductors--Testing--Methodology
- LCSH：Nuclear magnetic resonance spectroscopy
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Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions (: pbk)
J.-M. Spaeth, H. Overhof Springer, [2012], c2003
図書
Point defects in semiconductors and insulators : determination of atomic and electronic structure from paramagnetic hyperfine interactions
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Overhof, H. (Harald), 1942-
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Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995
International Conference on Defects in Semiconductors
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Postnikov, A. V. (Andreĭ Viktorovich)
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Point defects in materials
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